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S. Ahish, M. H. Vasantha, Y. B. N. Kumar and Dheeraj Sharma “Effect of Drain Doping and Temperature Variation on the Performance of Heterojunction Double Gate Tunnel Field Effect Transistor from a 2D ATLAS Simulation” in Journal of Nanoelectronics and Optoelectronics, vol. 12 (2), 162-170, 2017. |
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S. Ahish, D. Sharma, M. H. Vasantha, and Y. B. N. Kumar, “Performance analysis of InGaAs/GaAsP heterojunction double gate tunnel field effect transistorstor”; Journal of Superlattices and Microstructures, Elsevier, vol103, 93-101, 2017 (Impact Factor: 2.1). |
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B. Naresh Kumar Reddy, Vasantha.M.H., and Nithin Kumar Y.B., “High- Performance and Energy-Efficient Fault-Tolerance Core Mapping in NoC” Sustainable Computing, Elsevier Informatics and Systems, 2017. |
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B. Naresh Kumar Reddy, Vasantha.M.H., and Nithin Kumar Y.B., “System Level Fault-Tolerance Core Mapping and FPGA-based Verification of NoC”, Elsevier - Microelectronics Journal, 2017.
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B. Naresh Kumar Reddy, Vasantha.M.H. and Nithin Kumar Y.B.,“Hardware Implementation of Fault Tolerance NoC Core Mapping,” Telecommunication Systems (TELS), 2017. (Springer- Impact Factor= 1.542). |
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B. Naresh Kumar Reddy, Vasantha.M.H. and Nithin Kumar Y.B., “Energy-Aware and Reliability- Aware Mapping for NoC-Based Architectures,” Wireless Personal Communications, Vol. 100, pp. 213- 225, 2017. (Impact Factor= 1.20). |
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T. Veerakumar, BN Subudhi, S. Esakkirajan, and PK Pradhan, “Context model based edge preservation ?lter for impulse noise removal”, Expert Systems With Applications (Elsevier), Vol. 88, No. p. 29-44, 2017. (IF: 3.928). |
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S. Patidar, R. B. Pachori and A. Upadyay, U.R. Acharya, “An Integrated Alcoholic Index using Tunable-Q Wavelet Transform based Features Extracted from EEG Signals for Diagnosis of Alcoholism”, Applied Soft Computing Journal, vol. 50, pp. 71-78, 2017. (IF: 4.873). |
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Khalid Muzaffar, Krishnendu Chatterjee, Lalat Indu Giri, Shiban Koul, and Suneet Tuli, "Modelling and Analysis of Power Distribution of Electromagnetic Waves on Plane Surfaces Using Lock-in IR Thermography", J Nondestruct Eval, 36:60, 2017. |